The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...

“The development of differential fault analysis (DFA) techniques and mechanisms to inject faults into cryptographic circuits brings with it the need to use protection mechanisms that guarantee the ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Should x-ray inspection aim for fault comprehensiveness or should it concentrate on providing high-volume throughput? I broached the subject with Peter Edelstein, automated x-ray inspection (AXI) ...